Sample preparation using focused ion beam (FIB) for transmission Electron Microscopy (TEM) analysis was reviewed. Improving the quality of FIB prepared TEM sample has been an issue in the past. A specific site cross-sectional sample preparation method has been developed using FIB milling for TEM cha
Ultrastructural examination of dentin using focused ion-beam cross-sectioning and transmission electron microscopy
β Scribed by R.K. Nalla; A.E. Porter; C. Daraio; A.M. Minor; V. Radmilovic; E.A. Stach; A.P. Tomsia; R.O. Ritchie
- Book ID
- 108210316
- Publisher
- Elsevier Science
- Year
- 2005
- Tongue
- English
- Weight
- 664 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0968-4328
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