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Ultrafast thermoreflectance techniques for measuring thermal conductivity and interface thermal conductance of thin films

✍ Scribed by Zhu, Jie; Tang, Dawei; Wang, Wei; Liu, Jun; Holub, Kristopher W.; Yang, Ronggui

Book ID
111892229
Publisher
American Institute of Physics
Year
2010
Tongue
English
Weight
711 KB
Volume
108
Category
Article
ISSN
0021-8979

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The thermal conductivity of low-dielectric-constant (low-k) materials has been studied by a nano second thermoreflectance measurement system (Nano-TheMS). The Nano-TheMS, which utilizes thermoreflectance, can easily measure the thermal conductivity of thin film of nano-meter scale thickness. We have