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Thermal Conductivity Measurements of Thin Amorphous Silicon Films by Scanning Thermal Microscopy

✍ Scribed by S. Volz; X. Feng; C. Fuentes; P. Guérin; M. Jaouen

Book ID: 110399011
Publisher: Springer
Year: 2002
Tongue: English
Weight: 211 KB
Volume: 23
Category: Article
ISSN: 0195-928X
DOI: 10.1023/a:1020750203199

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