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Ultrafast characterization of in-plane-gate field-effect transistors: parasitics in laterally gated transistors

✍ Scribed by K. Ogawa; J. Allam; N. De B. Baynes; J. R. A. Cleaver; T. Mishima; I. Ohbu


Book ID
104954741
Publisher
Springer
Year
1996
Tongue
English
Weight
788 KB
Volume
28
Category
Article
ISSN
0306-8919

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