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Ultra-high resolution imaging of DNA and nucleosomes using non-contact atomic force microscopy

โœ Scribed by Emma Davies; Kar Seng Teng; Robert Steven Conlan; Stephen Patrick Wilks

Book ID
116465405
Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
278 KB
Volume
579
Category
Article
ISSN
0014-5793

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The atomic force microscope (AFM) system has evolved into a useful tool for direct measurements of intermolecular forces with atomic-resolution characterization that can be employed in a broad spectrum of applications. The distance between cantilever tip and sample surface in non-contact AFM is a ti