High resolution imaging for charged particles using CR-39 and atomic force microscopy

✍ Scribed by H Takahashi; K Amemiya; Y Kaizuka; M Nakazawa; N Yasuda; M Yamamoto; T Sakai; T Kamiya; S Okada

• Book ID: 118569272
• Publisher: Elsevier Science
• Year: 1999
• Tongue: English
• Weight: 538 KB
• Volume: 422
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/s0168-9002(98)01030-4