Ultra-high resolution radiography using CR-39 solid state track detectors and atomic force microscopy

✍ Scribed by Amemiya, K. (author);Takahashi, H. (author);Nakazawa, M. (author);Yasuda, N. (author);Yamamoto, M. (author);Nakagawa, Y. (author);Kageji, T. (author);Nakaichi, M. (author);Ogura, K. (author)

• Book ID: 114171563
• Publisher: Elsevier Science Publishers B.V.
• Year: 1999
• Tongue: English
• Weight: 311 KB
• Volume: 159
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/s0168-583x(99)00520-0