Two-dimensional modeling of the enhanced diffusion in thin base n-p-n bipolar transistors after lateral ion implantations

✍ Scribed by Denorme, S.; Mathiot, D.; Dollfus, P.; Mouis, M.

• Book ID: 114535985
• Publisher: IEEE
• Year: 1995
• Tongue: English
• Weight: 613 KB
• Volume: 42
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.368049