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Two-dimensional analysis of substrate-related kink phenomena in GaAs MESFET's

✍ Scribed by Horio, K.; Satoh, K.

Book ID
114535943
Publisher
IEEE
Year
1994
Tongue
English
Weight
644 KB
Volume
41
Category
Article
ISSN
0018-9383

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πŸ“œ SIMILAR VOLUMES

Two-dimensional analysis of cutoff frequ
Two-dimensional analysis of cutoff frequencies of GaAs MESFETS with various substrate conditions (invited article)
✍ Horio, Kazushige πŸ“‚ Article πŸ“… 1993 πŸ› John Wiley and Sons 🌐 English βš– 639 KB

## Abstract Cutoff frequencies of GaAs MESFETs are simulated by using a model that considers impurity compensation by deep levels in the semi‐insulating (SI) substrate. For a higher acceptor density SI substrate, an achievable cutoff frequency becomes higher because the substrate current becomes sm