An analysis of the kink phenomena in InAlAs/InGaAs HEMT's using two-dimensional device simulation

✍ Scribed by Suemitsu, T.; Enoki, T.; Sano, N.; Tomizawa, M.; Ishii, Y.

• Book ID: 114537488
• Publisher: IEEE
• Year: 1998
• Tongue: English
• Weight: 613 KB
• Volume: 45
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.735714