𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Two-dimensional analysis of cutoff frequencies of GaAs MESFETS with various substrate conditions (invited article)

✍ Scribed by Horio, Kazushige


Publisher
John Wiley and Sons
Year
1993
Tongue
English
Weight
639 KB
Volume
3
Category
Article
ISSN
1050-1827

No coin nor oath required. For personal study only.

✦ Synopsis


Abstract

Cutoff frequencies of GaAs MESFETs are simulated by using a model that considers impurity compensation by deep levels in the semi‐insulating (SI) substrate. For a higher acceptor density SI substrate, an achievable cutoff frequency becomes higher because the substrate current becomes smaller. Effects of introducing a p‐buffer layer are also studied in terms of dependencies on p‐layer thickness and its doping density. © 1993 John Wiley & Sons, Inc.