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Triple-axis X-ray diffraction analysis of highly oriented YBa2Cu3O7 thin films on LaAlO3 substrates

โœ Scribed by J.H. Li; W.-J. Lin; P.D. Hatton; Z.H. Mai; S.F. Xu


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
290 KB
Volume
245
Category
Article
ISSN
0921-4534

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