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Trapping-enhanced temperature variation of the threshold voltage of GaAs MESFET's

โœ Scribed by Chung-Hsu Chen; Shur, M.; Peczalski, A.


Book ID
114595581
Publisher
IEEE
Year
1986
Tongue
English
Weight
596 KB
Volume
33
Category
Article
ISSN
0018-9383

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