✦ LIBER ✦
A mechanism of threshold voltage changes for WNx gate GaAs MESFETs in high temperature storage life tests
✍ Scribed by Y. Kitaura; K. Ishida; T. Mizoguchi; N. Uchitomi; T. Matsunaga; M. Mochizuki; R. Nii
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 463 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.