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Transmission electron microscopy study of the formation of a contamination layer on the surface of porous silicon

✍ Scribed by J. Katcki; M. Bugajski

Publisher: Springer US
Year: 1994
Tongue: English
Weight: 883 KB
Volume: 5
Category: Article
ISSN: 0957-4522
DOI: 10.1007/bf00921252

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