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Atomic force microscopy study on the surface structure of oxidized porous silicon

✍ Scribed by T.F. Young; I.W. Huang; Y.L. Yang; W.C. Kuo; I.M. Jiang; T.C. Chang; C.Y. Chang

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 455 KB
Volume: 102
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(96)00087-6

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