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Atomic force microscopy study of thermal stability of silver selenide thin films grown on silicon

โœ Scribed by Bhaskar Chandra Mohanty; B.S. Murty; V. Vijayan; S. Kasiviswanathan


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
436 KB
Volume
252
Category
Article
ISSN
0169-4332

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Effect of heat treatment on silver selenide films grown from diffusion-reaction of Ag and Se films on Cr-buffered Si substrates was investigated up to 400 ยฐC. X-ray diffraction (XRD), Scanning electron microscopy (SEM), Secondary ion mass spectrometry (SIMS) and X-ray photoelectron spectroscopy (XPS