SIMS study of effect of Cr adhesion laye
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Bhaskar Chandra Mohanty; A.K. Tyagi; A.K. Balamurugan; Shikha Varma; S. Kasivisw
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Article
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2008
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Elsevier Science
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English
โ 283 KB
Effect of heat treatment on silver selenide films grown from diffusion-reaction of Ag and Se films on Cr-buffered Si substrates was investigated up to 400 ยฐC. X-ray diffraction (XRD), Scanning electron microscopy (SEM), Secondary ion mass spectrometry (SIMS) and X-ray photoelectron spectroscopy (XPS