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Transmission electron microscopy of CdTeCdS based solar cells

✍ Scribed by Y.Y. Loginov; K. Durose; H.M. Al-Allak; S.A. Galloway; S. Oktik; A.W. Brinkman; H. Richter; D. Bonnet


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
342 KB
Volume
161
Category
Article
ISSN
0022-0248

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In situ transmission electron microscopy was used to investigate the ageing behaviour of Si-based solar cells. The structural and compositional changes of the NiSi layer of such cells were determined. ageing tests. Figures 1B-D show the changes of the sample after t = 15, 60 and 120 min. Already aft