𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Transmission electron microscopy investigations of II–VI/GaAs heterostructures

✍ Scribed by P.D. Brown; Y.Y. Loginov; J.T. Mullins; K. Durose; A.W. Brinkman; C.J. Humphreys

Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
728 KB
Volume
138
Category
Article
ISSN
0022-0248

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Transmission Electron Microscopy of Be I
Transmission Electron Microscopy of Be Implanted Si-Doped GaAs
✍ Kroon, R.E. ;Neethling, J.H. ;Zolper, J.C. 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 264 KB

Be ions were implanted into degenerately Si-doped GaAs at 300 keV to a dose of 10 15 cm À2 . The region near the projected range remained crystalline, and subthreshold defects formed at this depth after annealing at 450-500 C. The defects are identified as circular prismatic perfect interstitial loo

Electron transmission microscopy of char
Electron transmission microscopy of charcoals impregnated with ammonium salts Of Cu(II) and Cr(VI)
✍ Victor R. Deitz; Jean N. Robinson; Edward J. Poziomek 📂 Article 📅 1975 🏛 Elsevier Science 🌐 English ⚖ 606 KB

Gas adsorbent charcoals were impregnated with simplified whetleriring solutions and the results compared with commercial whetlerites. Electron micrographs of the products showed a segregation of a considerable fraction of the added salts into crystalline areas, the latter ranging from 50 to 200 A in