✦ LIBER ✦

Trace metal analysis on hafnium silicate deposited Si wafer by Total Reflection X-ray Fluorescence

✍ Scribed by Hikari Takahara; Hiroyuki Murakami; Toru Kinashi; Chris Sparks

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Analysis of Ni on Si-wafer surfaces usin

✍ P. Wobrauschek; R. Görgl; P. Kregsamer; Ch. Streli; S. Pahlke; L. Fabry; M. Hall 📂 Article 📅 1997 🏛 Elsevier Science 🌐 English ⚖ 361 KB

Synchrotron radiation excited total refl

✍ N.S. Shin; C.H. Chang; Y.M. Koo; H. Padmore 📂 Article 📅 2001 🏛 Elsevier Science 🌐 English ⚖ 76 KB

Trace metal determinations by total-refl

✍ Diether Schmidt; Wolfgang Gerwinski; Ina Radke 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 739 KB

Determination of depth profiling of meta

✍ Q. -M. Fan; Y. -W. Liu; D. -L. Li; C. -L. Wei 📂 Article 📅 1993 🏛 Springer 🌐 English ⚖ 269 KB

Detection of metallic trace impurities o

✍ V. Penka; W. Hub 📂 Article 📅 1989 🏛 Springer 🌐 English ⚖ 396 KB

Detection of unknown localized contamina

✍ Yoshihiro Mori; Kenichi Uemura; Hiroshi Kohno; Motoyuki Yamagami; Takashi Yamada 📂 Article 📅 2004 🏛 Elsevier Science 🌐 English ⚖ 415 KB