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Towards understanding hole traps and NBTI of Ge/GeO2/Al2O3 structure

✍ Scribed by Ma, J.; Zhang, J.F.; Ji, Z.; Benbakhti, B.; Duan, M.; Zhang, W.; Zheng, X.F.; Mitard, J.; Kaczer, B.; Groeseneken, G.; Hall, S.; Robertson, J.; Chalker, P.

Book ID: 123320668
Publisher: Elsevier Science
Year: 2013
Tongue: English
Weight: 380 KB
Volume: 109
Category: Article
ISSN: 0167-9317
DOI: 10.1016/j.mee.2013.03.018

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