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TOV: Sequential Test Generation by Ordering of Test Vectors

✍ Scribed by Pomeranz, I.; Reddy, S.M.

Book ID: 117908395
Publisher: IEEE
Year: 2010
Tongue: English
Weight: 173 KB
Volume: 29
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.2010.2041985

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