Subsets of Primary Input Vectors in Sequential Test Generation for Single Stuck-at Faults

✍ Scribed by Pomeranz, I.

• Book ID: 114607599
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 113 KB
• Volume: 30
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/tcad.2011.2157158