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Totally self-checking CMOS circuit design for breaks and stuck-on faults

✍ Scribed by Cheema, M.S.; Lala, P.K.

Book ID: 119773608
Publisher: IEEE
Year: 1992
Tongue: English
Weight: 294 KB
Volume: 27
Category: Article
ISSN: 0018-9200
DOI: 10.1109/4.148330

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