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[IEEE 2013 International Conference on Technological Advances in Electrical, Electronics and Computer Engineering (TAEECE) - Konya, Turkey (2013.05.9-2013.05.11)] 2013 The International Conference on Technological Advances in Electrical, Electronics and Computer Engineering (TAEECE) - A unique technique for reducing the effects of hot-carrier induced degradations in CMOS bistable circuits for fault tolerant VLSI design

✍ Scribed by Das, A.G.M.

Book ID: 121234274
Publisher: IEEE
Year: 2013
Weight: 588 KB
Category: Article
ISBN: 1467356115
DOI: 10.1109/TAEECE.2013.6557294

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