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Comments on `Totally self-checking CMOS circuit design for breaks and stuck-on faults'

✍ Scribed by Bruls, E.; Sachdev, M.; Baker, K.

Book ID: 119773868
Publisher: IEEE
Year: 1993
Tongue: English
Weight: 161 KB
Volume: 28
Category: Article
ISSN: 0018-9200
DOI: 10.1109/4.237522

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