𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Total reflection X-ray fluorescence of single and multiple thin-layer samples

✍ Scribed by D.K.G. De Boer; W.W. Van Den Hoogenhof

Book ID
113374719
Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
915 KB
Volume
46
Category
Article
ISSN
0584-8547

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Total reflection X-ray fluorescence spec
Total reflection X-ray fluorescence spectrometry for quantitative surface and layer analysis
✍ U. Weisbrod; R. Gutschke; J. Knoth; H. Schwenke πŸ“‚ Article πŸ“… 1991 πŸ› Springer 🌐 English βš– 622 KB

Measurements of X-ray fluorescence spectra versus grazing incident angles provide information on elemental composition as well as density and thickness of near surface layers. Calculations of fluorescence intensities are presented, which are used for the evaluation of data obtained by total reflecti