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Total reflection X-ray fluorescence analysis: Physical foundations and analytical application (A review)

✍ Scribed by N. V. Alov

Book ID: 110167183
Publisher: SP MAIK Nauka/Interperiodica
Year: 2011
Tongue: English
Weight: 359 KB
Volume: 47
Category: Article
ISSN: 0020-1685
DOI: 10.1134/s0020168511140020

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