Total Ionizing Dose Effects in NOR and NAND Flash Memories

✍ Scribed by Cellere, Giorgio; Paccagnella, Alessandro; Visconti, Angelo; Bonanomi, Mauro; Beltrami, S.; Schwank, Jim R.; Shaneyfelt, Marty R.; Paillet, Philippe

• Book ID: 120209697
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 330 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2007.901199