Total ionizing dose effects in elementary devices for 180-nm flash technologies

✍ Scribed by Zhiyuan Hu; Zhangli Liu; Hua Shao; Zhengxuan Zhang; Bingxu Ning; Ming Chen; Dawei Bi; Shichang Zou

• Book ID: 104056486
• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 327 KB
• Volume: 51
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2011.03.026