Total Ionizing Dose effects in 130-nm commercial CMOS technologies for HEP experiments

✍ Scribed by L. Gonella; F. Faccio; M. Silvestri; S. Gerardin; D. Pantano; V. Re; M. Manghisoni; L. Ratti; A. Ranieri

• Book ID: 108223275
• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 280 KB
• Volume: 582
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/j.nima.2007.07.068