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Study of total ionizing dose radiation effects on enclosed gate transistors in a commercial CMOS technology

✍ Scribed by Dong-Mei, Li; Zhi-Hua, Wang; Li-Ying, Huangfu; Qiu-Jing, Gou

Book ID
115535594
Publisher
Institute of Physics
Year
2007
Tongue
English
Weight
1000 KB
Volume
16
Category
Article
ISSN
1009-1963

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