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Analysis of the TID Induced Failure Modes in NOR and NAND Flash Memories

✍ Scribed by Yan, Yihua; Chen, Wei; Fan, Ruyu; Guo, Xiaoqiang; Guo, Hongxia; Zhang, Fengqi; Ding, Lili; Zhang, Keying; Lin, Dongsheng; Wang, Yuanming

No coin nor oath required. For personal study only.

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