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Total-dose radiation-induced degradation of thin film ferroelectric capacitors

✍ Scribed by Schwank, J.R.; Nasby, R.D.; Miller, S.L.; Rodgers, M.S.; Dressendorfer, P.V.

Book ID: 125507318
Publisher: IEEE
Year: 1990
Tongue: English
Weight: 932 KB
Volume: 37
Category: Article
ISSN: 0018-9499
DOI: 10.1109/23.101180

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