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Mechanism of high temperature hydrogen reduced polarization degradation in Pb(Zr1−xTix)O3 ferroelectric thin film capacitors

✍ Scribed by Hui, Wenyuan ;Chen, Zhihui ;Liu, Xiaobing ;Jiang, Anquan

Book ID: 112180989
Publisher: John Wiley and Sons
Year: 2012
Tongue: English
Weight: 534 KB
Volume: 209
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.201127723

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