Electrode‐induced degradation of Pb(ZrxTi1-x)O3 (PZT) polarization hysteresis characteristics in Pt/PZT/Pt ferroelectric thin‐film capacitors

✍ Scribed by Kushida‐Abdelghafar, Keiko; Miki, Hiroshi; Torii, Kazuyoshi; Fujisaki, Yoshihisa

• Book ID: 118120645
• Publisher: American Institute of Physics
• Year: 1996
• Tongue: English
• Weight: 395 KB
• Volume: 69
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.117956