Total-dose effects in double-gate-controlled NPN bipolar transistors

✍ Scribed by Vandooren, A.; Yuan, J.; Flandre, D.; Colinge, J.P.

• Book ID: 114554957
• Publisher: IEEE
• Year: 2001
• Tongue: English
• Weight: 136 KB
• Volume: 48
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/23.960359