✦ LIBER ✦
Some features of degradation in bipolar transistors at different test conditions for total ionizing dose effect
✍ Scribed by A.S. Petrov; V.N. Ulimov
- Book ID
- 119326709
- Publisher
- Elsevier Science
- Year
- 2012
- Tongue
- English
- Weight
- 444 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0026-2714
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