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Total Dose and Dose Rate Radiation Characterization of EPI-CMOS Radiation Hardened Memory and Microprocessor Devices

โœ Scribed by Gingerich, B. L.; Hermsen, J. M.; Lee, J. C.; Schroeder, J. E.


Book ID
114663070
Publisher
IEEE
Year
1984
Tongue
English
Weight
769 KB
Volume
31
Category
Article
ISSN
0018-9499

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