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Total dose and displacement damage effects in a radiation-hardened CMOS APS

โœ Scribed by Bogaerts, J.; Dierickx, B.; Meynants, G.; Uwaerts, D.


Book ID
114616948
Publisher
IEEE
Year
2003
Tongue
English
Weight
680 KB
Volume
50
Category
Article
ISSN
0018-9383

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