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Total dose characterization of a CMOS technology at high dose rates and temperatures

โœ Scribed by Browning, J.S.; Connors, M.P.; Freshman, C.L.; Finney, G.A.


Book ID
114554635
Publisher
IEEE
Year
1988
Tongue
English
Weight
458 KB
Volume
35
Category
Article
ISSN
0018-9499

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