✦ LIBER ✦

Tip-induced heating in apertureless near-field optics

✍ Scribed by A. V. Malkovskiy; V. I. Malkovsky; A. M. Kisliuk; C. A. Barrios; M. D. Foster; A. P. Sokolov

Publisher: John Wiley and Sons
Year: 2009
Tongue: English
Weight: 302 KB
Volume: 40
Category: Article
ISSN: 0377-0486
DOI: 10.1002/jrs.2388

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Probing photonic and optoelectronic stru

Probing photonic and optoelectronic structures by Apertureless Scanning Near-Field Optical Microscopy

✍ Renaud Bachelot; Gilles Lerondel; Sylvain Blaize; Sebastien Aubert; Aurelien Bru 📂 Article 📅 2004 🏛 John Wiley and Sons 🌐 English ⚖ 546 KB

## Abstract This report presents the Apertureless Scanning Optical Near‐Field Microscope as a powerful tool for the characterization of modern optoelectronic and photonic components with sub‐wavelength resolution. We present an overview of the results we obtained in our laboratory over the past few

ChemInform Abstract: Tip-Enhanced Near-F

ChemInform Abstract: Tip-Enhanced Near-Field Optical Microscopy

✍ Achim Hartschuh 📂 Article 📅 2008 🏛 John Wiley and Sons ⚖ 15 KB 👁 2 views

Field Distribution Within Coaxial Scanni

Field Distribution Within Coaxial Scanning Near-Field Optical Microscope Tips

✍ F. Demming; A. von der Lieth; S. Klein; K. Dickmann 📂 Article 📅 2001 🏛 John Wiley and Sons 🌐 English ⚖ 235 KB 👁 2 views

Artifacts in scanning near-field optical

Artifacts in scanning near-field optical microscopy (SNOM) due to deficient tips

✍ Gerd Kaupp; Andreas Herrmann; Michael Haak 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 510 KB

Apertureless scanning near-field optical microscopy (SNOM) in the reflection-back-to-the-fiber configuration is possible on rough surfaces of practical importance and reaches 15 nm lateral resolution. The feedback for constant distance mode is provided by shear-force atomic force microscopy. Any art

Scanning Near-field Optical Microscopy i

Scanning Near-field Optical Microscopy in Life Science

✍ Andrea Jauß; Joachim Koenen; Klaus Weishaupt; Olaf Hollricher 📂 Article 📅 2002 🏛 John Wiley and Sons 🌐 English ⚖ 449 KB 👁 2 views

Depolarization near-field scanning optic

Depolarization near-field scanning optical microscopy: influence of wavelength and tip shape on the lateral resolution

✍ von Freymann, G.; Wegener, M.; Schimmel, Th. 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 96 KB 👁 2 views

We have demonstrated recently the operation of depolarization near-Ðeld scanning optical microscopy (DP-NSOM), a technique that allows optical near-Ðeld imaging with uncoated optical Ðbre tips by making use of the depolarizing e †ect of the tip-sample near-Ðeld. We have shown both experimentally and