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Timed circuit verification using TEL structures

✍ Scribed by Belluomini, W.; Myers, C.J.; Hofstee, H.P.

Book ID: 119778733
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 377 KB
Volume: 20
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.905681

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