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Time-resolved electroabsorption measurement of the electron velocity-field characteristic in GaN

โœ Scribed by Wraback, M.; Shen, H.; Carrano, J. C.; Li, T.; Campbell, J. C.; Schurman, M. J.; Ferguson, I. T.

Book ID
120672634
Publisher
American Institute of Physics
Year
2000
Tongue
English
Weight
263 KB
Volume
76
Category
Article
ISSN
0003-6951

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Measurements of the velocity-field chara
Measurements of the velocity-field characteristic in AlGaN/GaN heterostructures
โœ J.M Barker; D.K Ferry; S.M Goodnick; D.D Koleske; A.E Wickenden; R.L Henry ๐Ÿ“‚ Article ๐Ÿ“… 2002 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 186 KB

AlGaN / GaN test structures, with an etched constriction have been fabricated and tested with, and without, a gate. A pulsed voltage input with a 200 ns pulse width and a four-point measurement were used in a 50 V environment to determine the room temperature velocity-field characteristic of the str