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Time-of-flight secondary ion mass spectrometry with energetic cluster ion impact ionization for highly sensitive chemical structure characterization

✍ Scribed by Hirata, K.; Saitoh, Y.; Chiba, A.; Yamada, K.; Narumi, K.

Book ID: 121768508
Publisher: Elsevier Science
Year: 2013
Tongue: English
Weight: 667 KB
Volume: 314
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2013.05.045

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