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Formation of High-Mass Cluster Ions from Compound Semiconductors Using Time-of-Flight Secondary Ion Mass Spectrometry with Cluster Primary Ions

✍ Scribed by Goacher, Robyn E.; Luo, Hong; Gardella, Joseph A.

Book ID: 126116181
Publisher: American Chemical Society
Year: 2008
Tongue: English
Weight: 388 KB
Volume: 80
Category: Article
ISSN: 0003-2700
DOI: 10.1021/ac7024656

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