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Time-of-flight measurement of longitudinal carrier transport in a-Si:H/a-SiNx : H multilayer structures and gap state distribution in a-Si:H layers

✍ Scribed by R. Hattori; J. Shirafuji

Book ID: 115988320
Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 693 KB
Volume: 128
Category: Article
ISSN: 0022-3093
DOI: 10.1016/0022-3093(91)90780-a

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