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Time-of-flight measurement of hole transport in lightly boron-doped a-Si:H films

✍ Scribed by K. Shirakawa; J. Shirafuji

Book ID: 119443778
Publisher: Elsevier Science
Year: 1986
Tongue: English
Weight: 608 KB
Volume: 88
Category: Article
ISSN: 0022-3093
DOI: 10.1016/s0022-3093(86)80019-9

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