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Threshold Voltage Variation in SOI Schottky-Barrier MOSFETs

✍ Scribed by Min Zhang; Knoch, J.; Shi-Li Zhang; Feste, S.; Schroter, M.; Mantl, S.

Book ID: 114619130
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 679 KB
Volume: 55
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2007.915054

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