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Comparison of statistical variation of threshold voltage in bulk and SOI MOSFETs

✍ Scribed by Hung-sheng Chen; Sheng S. Li

Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
533 KB
Volume
35
Category
Article
ISSN
0038-1101

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πŸ“œ SIMILAR VOLUMES

Threshold voltage fluctuations induced b
Threshold voltage fluctuations induced by statistical β€˜position’ and β€˜number’ impurity fluctuations in bulk MOSFETs
✍ Yuri Yasuda; Makoto Takamiya; Toshiro Hiramoto πŸ“‚ Article πŸ“… 2000 πŸ› Elsevier Science 🌐 English βš– 146 KB

Threshold voltage (V th ) fluctuations due to the statistical impurity fluctuations in bulk MOSFETs are successfully separated into the impurity 'number' fluctuations and impurity 'position' distribution, and the mechanism of V th fluctuations in bulk MOSFETs is investigated by comparing bulk MOSFET